The right probe for the job
WENZEL provides a comprehensive range of Renishaw Scanning probes that can acquire several hundred surface points each second, enabling measurement of form as well as size and position. Scanning probes can also be used to acquire discrete points in a similar way to touch-trigger probes. A range of solutions is available, suitable for all sizes and configurations of CMM.
Scanning provides a fast way to capture form and profile data from prismatic or complex components.
While touch-trigger probes gather discrete points on the surface, scanning systems acquire vast quantities of surface data, providing a clearer picture of the form and shape of the workpiece. Scanning is therefore ideal for measurement applications where the form of a feature is a significant element of the overall error budget, or where complex surfaces must be inspected.
Scanning requires a fundamentally different approach to sensor design, machine control and data analysis.
Renishaw scanning probes feature innovative, lightweight passive mechanisms (no motors or locking mechanisms) that exhibit a high natural frequency, making them suitable for high speed scanning. Isolated optical metrology systems measure the deflection of the stylus directly (not via stacked axes within the probe mechanism) for better accuracy and faster dynamic response.
25 mm diameter scanning probe with scanning and touch-trigger modules
High-performance inspection, digitising and profile scanning
Quill-mounted scanning probe providing class-leading performance with long styli
Range of Renishaw touch trigger probing systems to meet the application needs and budget constraints of all CMM users.
Renishaw Touch Trigger Probes
Touch Trigger Probes
Range of Renishaw tool change racks to provide a more efficient coordinate measuring machine.
Renishaw Change Racks
Range of motorised and servo heads connecting a CMM probe to the machine quill, allowing automatic inspection of complex components.